The Library
Depth profile and lattice location analysis of Sb atoms in Si/Sb(-doped)/Si(001) structures using medium-energy ion scattering spectroscopy
Tools
Kobayashi, T., McConville, C. F. (Chris F.), Dorenbos, G., Iwaki, M. and Aono, M.. (1999) Depth profile and lattice location analysis of Sb atoms in Si/Sb(-doped)/Si(001) structures using medium-energy ion scattering spectroscopy. Applied Physics Letters, Vol.74 (No.5). pp. 673-675. ISSN 0003-6951
|
PDF
WRAP+Kobayashi_depth_profile.pdf - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader Download (118Kb) |
Official URL: http://dx.doi.org/10.1063/1.122983
Abstract
Medium-energy coaxial impact-collision ion scattering spectroscopy has been used to study the depth profile and lattice location of Sb atoms in Si/Sb(delta-doped)/Si(001) structures prepared by solid phase epitaxy. The Sb atoms are observed to diffuse into the Si capping layer at concentrations much higher than the solubility limit in a Si crystal. In addition, the concentration of diffused Sb atoms does not show a monotonic decrease with increasing distance from the delta-layer plane. The lattice locations of the diffused Sb atoms are found to be strongly dependent on the distance from the location of the original Sb delta layer.
| Item Type: | Journal Article |
|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering Q Science > QC Physics |
| Divisions: | Faculty of Science > Physics |
| Library of Congress Subject Headings (LCSH): | Silicon compounds, Semiconductors -- Junctions, Antimony, Annealing of metals |
| Journal or Publication Title: | Applied Physics Letters |
| Publisher: | American Institute of Physics |
| ISSN: | 0003-6951 |
| Date: | 1 February 1999 |
| Volume: | Vol.74 |
| Number: | No.5 |
| Page Range: | pp. 673-675 |
| Identification Number: | 10.1063/1.122983 |
| Status: | Peer Reviewed |
| Access rights to Published version: | Open Access |
| References: | # T. Kobayashi, S. Shimoda, M. Iwaki, and M. Aono, RIKEN Rev. 12, 33 (1996). # T. Kobayashi, T. Utiyama, K. Takagi, M. Iwaki, and M. Aono, Abstracts of the 12th International Vacuum Congress (IVC-12) and the 8th International Conference on Solid Surfaces (ICSS-8), The Hague, Oct., 1992, SS-ThP31. # T. Kobayashi, T. Utiyama, K. Takagi, M. Iwaki, and M. Aono, Abstracts of the 53rd Autumn Meeting of the Jpn. Soc. Appl. Phys., Suita, Sept., 1992, 18pZW10. # T. Kobayashi, G. Dorenbos, M. Iwaki, and M. Aono (unpublished). # T. Kobayashi, G. Dorenbos, S. Shimoda, M. Iwaki, and M. Aono, Nucl. Instrum. Methods Phys. Res. B 118, 584 (1996). # J. F. Zieglar, Helium Stopping Powers and Ranges in All Element Matter, Stopping and Ranges of Ions in Matter (Pergamon, New York, 1977), Vol. 4. # F. A. Trumbore, Bell Syst. Tech. J. 39, 205 (1960). # O. J. Marsh, J. W. Mayer, G. A. Shifrin, and D. Jamba, Appl. Phys. Lett. 11, 92 (1967). # J. A. Davies, J. Denhartog, L. Eriksson, and J. W. Mayer, Can. J. Phys. 45, 4053 (1967). |
| URI: | http://wrap.warwick.ac.uk/id/eprint/1002 |
Data sourced from Thomson Reuters' Web of Knowledge
Actions (login required)
![]() |
View Item |
Tools
Tools

