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On determining accurate positions, separations, and internal profiles for delta layers
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Dowsett, M. G., Kelly, J. H., Rowlands, G. (George), Ormsby, T. J., Guzman, B., Augustus, P. and Beanland, R. (2003) On determining accurate positions, separations, and internal profiles for delta layers. In: 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics (SIMS XIII), Nara, Japan, 11-16 Nov 2001. Published in: Surface Science, Volume 203 pp. 273-276. ISSN 0169-4332. doi:10.1016/S0169-4332(02)00646-3
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Official URL: http://dx.doi.org/10.1016/S0169-4332(02)00646-3
Abstract
We discuss the factors affecting estimates of the true depth of sharp features such as delta layers from their responses in SIMS depth profiles. We show that the apparent position of the centroid (or peak) is strongly dependent on the interval between deltas, and examine response coalscence as a function of beam energy. The peak-to-valley ratio in the coalesced response for two adjacent deltas must be >50 before parameters such as energy-dependent profile shifts can be established with sufficient accuracy. Similarly, the sampling density must yield >10-15 data points over the top three resolved orders of magnitude. Finally we show that a delta layer structure characterized by TEM provides very accurate depth calibration. (C) 2002 Elsevier Science B.V. All rights reserved.
| Item Type: | Conference Item (Paper) | ||||
|---|---|---|---|---|---|
| Subjects: | Q Science > QD Chemistry T Technology > TA Engineering (General). Civil engineering (General) Q Science > QC Physics |
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| Divisions: | Faculty of Science > Physics | ||||
| Journal or Publication Title: | Surface Science | ||||
| Publisher: | Elsevier BV | ||||
| ISSN: | 0169-4332 | ||||
| Official Date: | 15 January 2003 | ||||
| Dates: |
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| Volume: | Volume 203 | ||||
| Number of Pages: | 4 | ||||
| Page Range: | pp. 273-276 | ||||
| DOI: | 10.1016/S0169-4332(02)00646-3 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access | ||||
| Conference Paper Type: | Paper | ||||
| Title of Event: | 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics (SIMS XIII) | ||||
| Type of Event: | Conference | ||||
| Location of Event: | Nara, Japan | ||||
| Date(s) of Event: | 11-16 Nov 2001 |
Data sourced from Thomson Reuters' Web of Knowledge
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