UNSPECIFIED (2003) Low energy SIMS characterisation of ultra thin oxides on ferrous alloys. In: 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics (SIMS XIII), NOV 11-16, 2001, NARA, JAPAN.

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Abstract

Ultra low energy SIMS was used to create chemical depth profiles of Fe-Cr alloys and stainless steels in order to assess the effect of alloying additions on the surface oxide films. The results have thus far demonstrated that the nanometer scale surface oxide films formed on Fe-Cr alloys are strongly related to the alloy composition and that a critical composition exists corresponding to a change in the oxide chemistry. This composition can be related to differences in electrochemical behaviour of these alloys. This technique allows the effect of individual alloying elements on the surface oxide to be evaluated at previously unavailable depth resolution. (C) 2002 Elsevier Science B.V. All rights reserved.

Item Type:	Conference Item (UNSPECIFIED)
Subjects:	Q Science > QD Chemistry T Technology > TA Engineering (General). Civil engineering (General) Q Science > QC Physics
Journal or Publication Title:	Surface Science
Publisher:	ELSEVIER SCIENCE BV
ISSN:	0169-4332
Date:	15 January 2003
Volume:	203
Number of Pages:	5
Page Range:	pp. 660-664
Publication Status:	Published
Title of Event:	13th International Conference on Secondary Ion Mass Spectrometry and Related Topics (SIMS XIII)
Location of Event:	NARA, JAPAN
Date(s) of Event:	NOV 11-16, 2001
URI:	http://wrap.warwick.ac.uk/id/eprint/10116

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