Low energy SIMS characterisation of ultra thin oxides on ferrous alloys
UNSPECIFIED (2003) Low energy SIMS characterisation of ultra thin oxides on ferrous alloys. In: 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics (SIMS XIII), NOV 11-16, 2001, NARA, JAPAN.Full text not available from this repository.
Ultra low energy SIMS was used to create chemical depth profiles of Fe-Cr alloys and stainless steels in order to assess the effect of alloying additions on the surface oxide films. The results have thus far demonstrated that the nanometer scale surface oxide films formed on Fe-Cr alloys are strongly related to the alloy composition and that a critical composition exists corresponding to a change in the oxide chemistry. This composition can be related to differences in electrochemical behaviour of these alloys. This technique allows the effect of individual alloying elements on the surface oxide to be evaluated at previously unavailable depth resolution. (C) 2002 Elsevier Science B.V. All rights reserved.
|Item Type:||Conference Item (UNSPECIFIED)|
|Subjects:||Q Science > QD Chemistry
T Technology > TA Engineering (General). Civil engineering (General)
Q Science > QC Physics
|Journal or Publication Title:||Surface Science|
|Publisher:||ELSEVIER SCIENCE BV|
|Date:||15 January 2003|
|Number of Pages:||5|
|Page Range:||pp. 660-664|
|Title of Event:||13th International Conference on Secondary Ion Mass Spectrometry and Related Topics (SIMS XIII)|
|Location of Event:||NARA, JAPAN|
|Date(s) of Event:||NOV 11-16, 2001|
Actions (login required)