De Giovanni, Mario, Alam, Talukder, Banerjee, Rajarshi and Srirangam, Prakash (2018) 3D atom probe tomography study on segregation of yttrium in modified Al-Si alloys. JOM, 70 (9). pp. 1765-1770. doi:10.1007/s11837-018-2909-x ISSN 1543-1851.

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Abstract

Yttrium segregation behavior in Al-Si alloys has been studied using the three-dimensional atom probe tomography technique. Al-Si alloys were prepared by casting method, and yttrium was added to modify the eutectic silicon morphology in these alloys. The results indicated that yttrium is preferentially located within the Si phase, with the highest concentration at the interface between eutectic Al and eutectic Si.

Item Type:	Journal Article
Subjects:	T Technology > TA Engineering (General). Civil engineering (General)
Divisions:	Faculty of Science, Engineering and Medicine > Engineering > WMG (Formerly the Warwick Manufacturing Group)
Library of Congress Subject Headings (LCSH):	Aluminum-silicon alloys, Yttrium, Tomography
Journal or Publication Title:	JOM
Publisher:	Springer New York LLC
ISSN:	1543-1851
Official Date:	September 2018
Dates:	Date Event September 2018 Published 15 May 2018 Available 28 April 2018 Accepted
Volume:	70
Number:	9
Page Range:	pp. 1765-1770
DOI:	10.1007/s11837-018-2909-x
Status:	Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Open Access (Creative Commons)
Date of first compliant deposit:	18 May 2018
Date of first compliant Open Access:	18 May 2018

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