Hu, Z. W., Thomas, Pam A., Gupta, Mool C. and Risk, William Paul. (1995) Multiple-crystal X-ray topographic characterization of periodically domain-inverted KTiOPO4 crystal. Applied Physics Letters, Vol.66 (No.1). pp. 13-15. ISSN 0003-6951

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Abstract

A periodically domain-inverted KTiOPO4 crystal has been characterized for the first time by multiple-crystal multiple-reflection x-ray topography. The striation contrast within the domain- inverted regions has been revealed in high strain-sensitivity reflection topographs. The origin of formation of the striation contrast and the mechanism of domain inversion in KTiOPO4 are discussed in terms of the structural characteristics of KTiOPO4.

Item Type:	Journal Article
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering Q Science > QC Physics
Divisions:	Faculty of Science > Physics
Library of Congress Subject Headings (LCSH):	Potassium compounds, Titanates, Phosphates, X-rays -- Diffraction, Heterostructures
Journal or Publication Title:	Applied Physics Letters
Publisher:	American Institute of Physics
ISSN:	0003-6951
Date:	2 January 1995
Volume:	Vol.66
Number:	No.1
Page Range:	pp. 13-15
Identification Number:	10.1063/1.114165
Status:	Peer Reviewed
Access rights to Published version:	Open Access
Funder:	Science and Engineering Research Council (Great Britain) (SERC)
Grant number:	GR/T 02414 (SERC)
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URI:	http://wrap.warwick.ac.uk/id/eprint/1032

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