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Quantifying the critical thickness of electron hybridization in spintronics materials

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Pincelli, T., Lollobrigida, V., Borgatti, F., Regoutz, A., Gobaut, B., Schlueter, C., Lee, T. -L., Payne, D. J., Oura, M., Tamasaku, K. et al.
(2017) Quantifying the critical thickness of electron hybridization in spintronics materials. Nature Communications, 8 . 16051. doi:10.1038/ncomms16051 ISSN 2041-1723.

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Official URL: http://dx.doi.org/10.1038/ncomms16051

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Abstract

In the rapidly growing field of spintronics, simultaneous control of electronic and magnetic properties is essential, and the perspective of building novel phases is directly linked to the control of tuning parameters, for example, thickness and doping. Looking at the relevant effects in interface-driven spintronics, the reduced symmetry at a surface and interface corresponds to a severe modification of the overlap of electron orbitals, that is, to a change of electron hybridization. Here we report a chemically and magnetically sensitive depth-dependent analysis of two paradigmatic systems, namely La1−xSrxMnO3 and (Ga,Mn)As. Supported by cluster calculations, we find a crossover between surface and bulk in the electron hybridization/correlation and we identify a spectroscopic fingerprint of bulk metallic character and ferromagnetism versus depth. The critical thickness and the gradient of hybridization are measured, setting an intrinsic limit of 3 and 10 unit cells from the surface, respectively, for (Ga,Mn)As and La1−xSrxMnO3, for fully restoring bulk properties.

Item Type: Journal Article
Divisions: Faculty of Science, Engineering and Medicine > Engineering > Engineering
Journal or Publication Title: Nature Communications
Publisher: Nature Publishing Group
ISSN: 2041-1723
Official Date: 2017
Dates:
DateEvent
2017Published
15 May 2017Accepted
Volume: 8
Article Number: 16051
DOI: 10.1038/ncomms16051
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access

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