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Patel, Anisha N. and Kranz, Christine (2018) (Multi)functional atomic force microscopy imaging. Annual Review of Analytical Chemistry, 11 (1). pp. 329-350. doi:10.1146/annurev-anchem-061417-125716 ISSN 1936-1327.
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Official URL: http://dx.doi.org/10.1146/annurev-anchem-061417-12...
Abstract
Incorporating functionality to atomic force microscopy (AFM) to obtain physical and chemical information has always been a strong focus in AFM research. Modifying AFM probes with specific molecules permits accessibility of chemical information via specific reactions and interactions. Fundamental understanding of molecular processes at the solid/liquid interface with high spatial resolution is essential to many emerging research areas. Nanoscale electrochemical imaging has emerged as a complementary technique to advanced AFM techniques, providing information on electrochemical interfacial processes. While this review presents a brief introduction to advanced AFM imaging modes, such as multiparametric AFM and topography recognition imaging, the main focus herein is on electrochemical imaging via hybrid AFM-scanning electrochemical microscopy. Recent applications and the challenges associated with such nanoelectrochemical imaging strategies are presented.
Item Type: | Journal Article | ||||||
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Divisions: | Faculty of Science, Engineering and Medicine > Engineering > WMG (Formerly the Warwick Manufacturing Group) | ||||||
Journal or Publication Title: | Annual Review of Analytical Chemistry | ||||||
Publisher: | Annual Reviews | ||||||
ISSN: | 1936-1327 | ||||||
Official Date: | June 2018 | ||||||
Dates: |
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Volume: | 11 | ||||||
Number: | 1 | ||||||
Page Range: | pp. 329-350 | ||||||
DOI: | 10.1146/annurev-anchem-061417-125716 | ||||||
Status: | Peer Reviewed | ||||||
Publication Status: | Published | ||||||
Access rights to Published version: | Restricted or Subscription Access |
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