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Optimising edge detector accuracy for individual image acquisition systems

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UNSPECIFIED (1999) Optimising edge detector accuracy for individual image acquisition systems. In: 7th IEE Conference on Image Processing and its Applications (IPA99), JUL 12-15, 1999, UNIV MANCHESTER, MANCHESTER, ENGLAND.

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Abstract

Simple edge detectors compute quickly. Recent research has enabled detector accuracy to be measured on realistic edges that have been smoothed by a particular acquisition system. The simulation of such edges and an efficient method of optimising detectors is reported.

Item Type: Conference Item (UNSPECIFIED)
Subjects: Q Science > QA Mathematics > QA76 Electronic computers. Computer science. Computer software
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Q Science > QC Physics
Series Name: IEE CONFERENCE PUBLICATIONS
Journal or Publication Title: SEVENTH INTERNATIONAL CONFERENCE ON IMAGE PROCESSING AND ITS APPLICATIONS
Publisher: INST ELECTRICAL ENGINEERS INSPEC INC
ISBN: 0-85296-717-9
ISSN: 0537-9989
Date: 1999
Number: 465
Number of Pages: 5
Page Range: pp. 143-147
Publication Status: Published
Title of Event: 7th IEE Conference on Image Processing and its Applications (IPA99)
Location of Event: UNIV MANCHESTER, MANCHESTER, ENGLAND
Date(s) of Event: JUL 12-15, 1999
URI: http://wrap.warwick.ac.uk/id/eprint/11433

Data sourced from Thomson Reuters' Web of Knowledge

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