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Optimising edge detector accuracy for individual image acquisition systems
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UNSPECIFIED (1999) Optimising edge detector accuracy for individual image acquisition systems. In: 7th IEE Conference on Image Processing and its Applications (IPA99), JUL 12-15, 1999, UNIV MANCHESTER, MANCHESTER, ENGLAND.
Full text not available from this repository.Abstract
Simple edge detectors compute quickly. Recent research has enabled detector accuracy to be measured on realistic edges that have been smoothed by a particular acquisition system. The simulation of such edges and an efficient method of optimising detectors is reported.
| Item Type: | Conference Item (UNSPECIFIED) |
|---|---|
| Subjects: | Q Science > QA Mathematics > QA76 Electronic computers. Computer science. Computer software T Technology > TK Electrical engineering. Electronics Nuclear engineering Q Science > QC Physics |
| Series Name: | IEE CONFERENCE PUBLICATIONS |
| Journal or Publication Title: | SEVENTH INTERNATIONAL CONFERENCE ON IMAGE PROCESSING AND ITS APPLICATIONS |
| Publisher: | INST ELECTRICAL ENGINEERS INSPEC INC |
| ISBN: | 0-85296-717-9 |
| ISSN: | 0537-9989 |
| Date: | 1999 |
| Number: | 465 |
| Number of Pages: | 5 |
| Page Range: | pp. 143-147 |
| Publication Status: | Published |
| Title of Event: | 7th IEE Conference on Image Processing and its Applications (IPA99) |
| Location of Event: | UNIV MANCHESTER, MANCHESTER, ENGLAND |
| Date(s) of Event: | JUL 12-15, 1999 |
| URI: | http://wrap.warwick.ac.uk/id/eprint/11433 |
Data sourced from Thomson Reuters' Web of Knowledge
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