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Simultaneous fault models for the generation and location of efficient error detection mechanisms
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Leeke, Matthew (2020) Simultaneous fault models for the generation and location of efficient error detection mechanisms. The Computer Journal, 63 (5). pp. 758-773. doi:10.1093/comjnl/bxz022 ISSN 0010-4620.
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Official URL: https://doi.org/10.1093/comjnl/bxz022
Abstract
The application of machine learning to software fault injection data has been shown to be an effective approach for the generation of efficient error detection mechanisms (EDMs). However, such approaches to the design of EDMs have invariably adopted a fault model with a single-fault assumption, limiting the relevance of the detectors and their evaluation. Software containing more than a single fault is commonplace, with safety standards recognizing that critical failures are often the result of unlikely or unforeseen combinations of faults. This paper addresses this shortcoming, demonstrating that it is possible to generate efficient EDMs under simultaneous fault models. In particular, it is shown that (i) efficient EDMs can be designed using fault injection data collected under models accounting for the occurrence of simultaneous faults, (ii) exhaustive fault injection under a simultaneous bit flip model can yield improved EDM efficiency, (iii) exhaustive fault injection under a simultaneous bit flip model can be made non-exhaustive and (iv) EDMs can be relocated within a software system using program slicing, reducing the resource costs of experimentation to practicable levels without sacrificing EDM efficiency.
Item Type: | Journal Article | ||||||||
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Subjects: | Q Science > QA Mathematics > QA76 Electronic computers. Computer science. Computer software | ||||||||
Divisions: | Faculty of Science, Engineering and Medicine > Science > Computer Science | ||||||||
Library of Congress Subject Headings (LCSH): | Errors, Machine learning | ||||||||
Journal or Publication Title: | The Computer Journal | ||||||||
Publisher: | Oxford University Press | ||||||||
ISSN: | 0010-4620 | ||||||||
Official Date: | May 2020 | ||||||||
Dates: |
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Volume: | 63 | ||||||||
Number: | 5 | ||||||||
Page Range: | pp. 758-773 | ||||||||
DOI: | 10.1093/comjnl/bxz022 | ||||||||
Status: | Peer Reviewed | ||||||||
Publication Status: | Published | ||||||||
Reuse Statement (publisher, data, author rights): | This is a pre-copyedited, author-produced version of an article accepted for publication in The Computer Journal following peer review. The version of record: Simultaneous Fault Models for the Generation and Location of Efficient Error Detection Mechanisms, Matthew Leeke, The Computer Journal, bxz022, is available online at: https://doi.org/10.1093/comjnl/bxz022 | ||||||||
Access rights to Published version: | Restricted or Subscription Access | ||||||||
Date of first compliant deposit: | 27 February 2019 | ||||||||
Date of first compliant Open Access: | 30 April 2021 | ||||||||
RIOXX Funder/Project Grant: |
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