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The XMaS beamline at ESRF: instrumental developments and high resolution diffraction studies
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UNSPECIFIED (2001) The XMaS beamline at ESRF: instrumental developments and high resolution diffraction studies. JOURNAL OF SYNCHROTRON RADIATION, 8 (Part 6). pp. 1172-1181. ISSN 0909-0495
Full text not available from this repository.Abstract
The beamline, which is situated on a bending magnet at ESRF, comprises a unique combination of instrumentation for high-resolution and magnetic single-crystal diffraction. White-beam operation is possible, as well as focused and unfocused monochromatic modes. In addition to an eleven-axis Huber diffractometer, which facilitates simple operation in both vertical and horizontal scattering geometries, there is an in-vacuum polarisation analyser and slit system, mirrors for harmonic rejection, sub 4.2 K and 1 Tesla magnetic field sample environment, plus a diamond phase plate for polarisation conditioning. The instrumentation developed specifically for this beamline is described, and its use illustrated by recent scientific results.
| Item Type: | Journal Article |
|---|---|
| Subjects: | Q Science > QC Physics |
| Journal or Publication Title: | JOURNAL OF SYNCHROTRON RADIATION |
| Publisher: | MUNKSGAARD INT PUBL LTD |
| ISSN: | 0909-0495 |
| Date: | November 2001 |
| Volume: | 8 |
| Number: | Part 6 |
| Number of Pages: | 10 |
| Page Range: | pp. 1172-1181 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/11636 |
Data sourced from Thomson Reuters' Web of Knowledge
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