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Exploiting total internal reflection geometry for terahertz devices and enhanced sample characterization
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Sun, Qiushuo, Chen, Xuequan, Liu, Xudong, Stantchev, Rayko I. and Pickwell-MacPherson, Emma (2020) Exploiting total internal reflection geometry for terahertz devices and enhanced sample characterization. Advanced Optical Materials, 8 (3). 1900535. doi:10.1002/adom.201900535 ISSN 2195-1071.
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Official URL: https://doi.org/10.1002/adom.201900535
Abstract
To promote potential applications of terahertz (THz) technology more advanced functional THz devices with high performance are needed, including modulators, polarizers, lenses, wave retarders and anti-reflection coatings. This article summarizes recent progress in THz components built on functional materials including graphene, vanadium dioxide and metamaterials. Our key message is that while the choice of materials used in such devices is important, the geometry in which they are employed also has a significant effect on the performance achieved. In particular, we review devices operating in total internal reflection geometry and explain how this geometry is able to be exploited to achieve a variety of THz devices with broadband operation
| Item Type: | Journal Article | ||||||||||||
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| Subjects: | Q Science > QC Physics T Technology > TA Engineering (General). Civil engineering (General) T Technology > TK Electrical engineering. Electronics Nuclear engineering |
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| Divisions: | Faculty of Science, Engineering and Medicine > Science > Physics | ||||||||||||
| Library of Congress Subject Headings (LCSH): | Terahertz spectroscopy , Terahertz technology, Graphene , Metamaterials , Total internal reflection (Optics) | ||||||||||||
| Journal or Publication Title: | Advanced Optical Materials | ||||||||||||
| Publisher: | Wiley-Blackwell Publishing, Inc | ||||||||||||
| ISSN: | 2195-1071 | ||||||||||||
| Official Date: | 5 February 2020 | ||||||||||||
| Dates: |
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| Volume: | 8 | ||||||||||||
| Number: | 3 | ||||||||||||
| Article Number: | 1900535 | ||||||||||||
| DOI: | 10.1002/adom.201900535 | ||||||||||||
| Status: | Peer Reviewed | ||||||||||||
| Publication Status: | Published | ||||||||||||
| Reuse Statement (publisher, data, author rights): | This is the peer reviewed version of the following article: Sun, Q., Chen, X., Liu, X., Stantchev, R. I., Pickwell‐MacPherson, E., Exploiting Total Internal Reflection Geometry for Terahertz Devices and Enhanced Sample Characterization. Advanced Optical Materials 2019, 1900535. https://doi.org/10.1002/adom.201900535, which has been published in final form at https://doi.org/10.1002/adom.201900535. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions. | ||||||||||||
| Access rights to Published version: | Restricted or Subscription Access | ||||||||||||
| Date of first compliant deposit: | 24 May 2019 | ||||||||||||
| Date of first compliant Open Access: | 11 June 2020 | ||||||||||||
| RIOXX Funder/Project Grant: |
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