The Library
Conducting-atomic force microscopy investigation of the local electrical characteristics of a Ti/TiO2/Pt anode
Tools
Tools
Tools
UNSPECIFIED. (2001) Conducting-atomic force microscopy investigation of the local electrical characteristics of a Ti/TiO2/Pt anode. ELECTROCHEMICAL AND SOLID STATE LETTERS, 4 (9). E33-E36. ISSN 1099-0062
Full text not available from this repository.
Official URL: http://dx.doi.org/10.1149/1.1388195
Abstract
Pt microwire atomic force microscope (AFM) probes have been employed to characterize the electrical and topographical properties of a Ti/TiO2/Pt anode. The anode consisted of supported Pt metal microparticles in a porous Ti/TiO2 film. Pt microwire probes were found to be more reliable than Pt-coated Si3N4 tips for conductivity mapping in contact mode. Preliminary results revealed a marked spatial heterogeneity in the current-voltage characteristics of the Pt microdeposits, attributed to the nature of the subsurface Pt contact to the underlying Ti/TiO2 substrate. Prospects for using conducting-AFM more widely to characterize the local electrical properties of complex electrode materials are highlighted. (C) 2001 The Electrochemical Society.
| Item Type: | Journal Article |
|---|---|
| Subjects: | Q Science > QD Chemistry T Technology > TA Engineering (General). Civil engineering (General) |
| Journal or Publication Title: | ELECTROCHEMICAL AND SOLID STATE LETTERS |
| Publisher: | ELECTROCHEMICAL SOC INC |
| ISSN: | 1099-0062 |
| Date: | September 2001 |
| Volume: | 4 |
| Number: | 9 |
| Number of Pages: | 4 |
| Page Range: | E33-E36 |
| Identification Number: | 10.1149/1.1388195 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/11863 |
Data sourced from Thomson Reuters' Web of Knowledge
Actions (login required)
 |
View Item |
