Conducting-atomic force microscopy investigation of the local electrical characteristics of a Ti/TiO2/Pt anode
UNSPECIFIED. (2001) Conducting-atomic force microscopy investigation of the local electrical characteristics of a Ti/TiO2/Pt anode. ELECTROCHEMICAL AND SOLID STATE LETTERS, 4 (9). E33-E36. ISSN 1099-0062Full text not available from this repository.
Official URL: http://dx.doi.org/10.1149/1.1388195
Pt microwire atomic force microscope (AFM) probes have been employed to characterize the electrical and topographical properties of a Ti/TiO2/Pt anode. The anode consisted of supported Pt metal microparticles in a porous Ti/TiO2 film. Pt microwire probes were found to be more reliable than Pt-coated Si3N4 tips for conductivity mapping in contact mode. Preliminary results revealed a marked spatial heterogeneity in the current-voltage characteristics of the Pt microdeposits, attributed to the nature of the subsurface Pt contact to the underlying Ti/TiO2 substrate. Prospects for using conducting-AFM more widely to characterize the local electrical properties of complex electrode materials are highlighted. (C) 2001 The Electrochemical Society.
|Item Type:||Journal Article|
|Subjects:||Q Science > QD Chemistry
T Technology > TA Engineering (General). Civil engineering (General)
|Journal or Publication Title:||ELECTROCHEMICAL AND SOLID STATE LETTERS|
|Publisher:||ELECTROCHEMICAL SOC INC|
|Official Date:||September 2001|
|Number of Pages:||4|
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