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Exceptional surface passivation arising from bis(trifluoromethanesulfonyl)-based solutions

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Pointon, A. I., Grant, Nicholas E., Bonilla, R. S., Wheeler-Jones, Evé, Walker, Marc, Wilshaw, P. R., Dancer, Claire E. J. and Murphy, John D. (2019) Exceptional surface passivation arising from bis(trifluoromethanesulfonyl)-based solutions. ACS Applied Electronic Materials, 1 (7). pp. 1322-1329. doi:10.1021/acsaelm.9b00251

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Official URL: https://doi.org/10.1021/acsaelm.9b00251

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Abstract

The surface properties of many inorganic electronic materials (e.g. MoS2, WSe2, Si) can be substantially modified by treatment with the superacid bis(trifluoromethane)sulfonimide (TFSI). Here we find more generally that solutions based on molecules with trifluoromethanesulfonyl groups, including TFSI, give rise to excellent room temperature surface passivation, with the common factor being the presence of CF3SO2 groups and not the solution’s acidity. The mechanism of passivation comprises two effects: (i) chemical passivation; and (ii) field effect passivation from a negatively charged thin film likely to be physically adsorbed by the surface. Degradation of surface passivation is caused by de-adsorption of the thin film from the surface, and occurs slowly in air and rapidly upon vacuum exposure. The passivation’s air stability is enhanced by the presence of droplets at the surface which act to protect the properties of the film. The finding that non-acidic solutions can provide excellent electrical passivation at room temperature opens up the possibility of using them on materials more sensitive to an acidic environment.

Item Type: Journal Article
Subjects: Q Science > QC Physics
Q Science > QD Chemistry
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Science, Engineering and Medicine > Engineering > Engineering
Library of Congress Subject Headings (LCSH): Passive components, Passivity (Chemistry), Electronics -- Materials, Surfaces, Superacids, Luminescence
Journal or Publication Title: ACS Applied Electronic Materials
Publisher: American Chemical Society
ISSN: 2637-6113
Official Date: 23 July 2019
Dates:
DateEvent
23 July 2019Published
13 June 2019Available
13 June 2019Accepted
Volume: 1
Number: 7
Page Range: pp. 1322-1329
DOI: 10.1021/acsaelm.9b00251
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Open Access
RIOXX Funder/Project Grant:
Project/Grant IDRIOXX Funder NameFunder ID
EP/M024911/1[EPSRC] Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
EP/R511808/1[EPSRC] Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
EP/N509796/1[EPSRC] Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
EP/L015307/1[EPSRC] Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
EP/M022196/1[EPSRC] Engineering and Physical Sciences Research Councilhttp://dx.doi.org/10.13039/501100000266
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