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Bias temperature instability and condition monitoring in SiC power MOSFETs
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Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2018) Bias temperature instability and condition monitoring in SiC power MOSFETs. Microelectronics Reliability, 88-90 . pp. 557-562. doi:10.1016/j.microrel.2018.06.045 ISSN 0026-2714.
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Official URL: http://dx.doi.org/10.1016/j.microrel.2018.06.045
Item Type: | Journal Article | ||||||
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Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||||
Journal or Publication Title: | Microelectronics Reliability | ||||||
Publisher: | Pergamon-Elsevier Science Ltd. | ||||||
ISSN: | 0026-2714 | ||||||
Official Date: | September 2018 | ||||||
Dates: |
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Volume: | 88-90 | ||||||
Page Range: | pp. 557-562 | ||||||
DOI: | 10.1016/j.microrel.2018.06.045 | ||||||
Status: | Peer Reviewed | ||||||
Publication Status: | Published | ||||||
Access rights to Published version: | Restricted or Subscription Access |
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