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Narrowing of band gap at source/drain contact scheme of nanoscale InAs–nMOS

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Mohamed, A. H., Oxland, R., Aldegunde, M., Hepplestone, S. P., Sushko, P. V. and Kalna, K. (2018) Narrowing of band gap at source/drain contact scheme of nanoscale InAs–nMOS. Solid-State Electronics, 142 . pp. 31-35. doi:10.1016/j.sse.2018.01.006

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Official URL: http://dx.doi.org/10.1016/j.sse.2018.01.006

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Item Type: Journal Article
Divisions: Faculty of Science > Engineering
Journal or Publication Title: Solid-State Electronics
Publisher: Elsevier
ISSN: 0038-1101
Official Date: April 2018
Dates:
DateEvent
April 2018Published
31 January 2018Accepted
Volume: 142
Page Range: pp. 31-35
DOI: 10.1016/j.sse.2018.01.006
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access

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