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Novel method for evaluation of negative bias temperature instability of SiC MOSFETs
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Gonzalez, Jose Ortiz, Alatise, Olayiwola M. and Mawby, Philip. A. (2019) Novel method for evaluation of negative bias temperature instability of SiC MOSFETs. Materials Science Forum, 963 . pp. 749-752. doi:10.4028/www.scientific.net/MSF.963.749 (In Press)
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Official URL: https://doi.org/10.4028/www.scientific.net/MSF.963...
| Item Type: | Journal Article | ||||||
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| Divisions: | Faculty of Science > Engineering | ||||||
| Journal or Publication Title: | Materials Science Forum | ||||||
| Publisher: | Trans Tech Publications Ltd. | ||||||
| ISSN: | 1662-9752 | ||||||
| Official Date: | 19 July 2019 | ||||||
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| Date of first compliant deposit: | 18 July 2019 | ||||||
| Volume: | 963 | ||||||
| Page Range: | pp. 749-752 | ||||||
| DOI: | 10.4028/www.scientific.net/MSF.963.749 | ||||||
| Status: | Peer Reviewed | ||||||
| Publication Status: | In Press | ||||||
| Access rights to Published version: | Restricted or Subscription Access | ||||||
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