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Impact of Leakage Currents on Voltage Sharing in Series Connected SiC Power MOSFETs and Silicon IGBT Devices
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Davletzhanova, Zarina, Alatise, Olayiwola M., Bonyadi, Roozbeh, Gonzalez, Jose Ortiz, Chan, Chun Wa, Bonyadi, Yeganeh, Jennings, Mike and Mawby, P. A. (Philip A.) (2018) Impact of Leakage Currents on Voltage Sharing in Series Connected SiC Power MOSFETs and Silicon IGBT Devices. In: 20th European Conference on Power Electronics and Applications, Riga, Latvia, 17-21 September 2018. Published in: 2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe) ISBN 9781538641453 .
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Official URL: http://www.epe2018.com/
| Item Type: | Conference Item (Paper) | ||||
|---|---|---|---|---|---|
| Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||
| Journal or Publication Title: | 2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe) | ||||
| Publisher: | IEEE | ||||
| ISBN: | 9781538641453 | ||||
| Official Date: | November 2018 | ||||
| Dates: |
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| Article Number: | 8515592 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access | ||||
| Conference Paper Type: | Paper | ||||
| Title of Event: | 20th European Conference on Power Electronics and Applications | ||||
| Type of Event: | Conference | ||||
| Location of Event: | Riga, Latvia | ||||
| Date(s) of Event: | 17-21 September 2018 | ||||
| Related URLs: |
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