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Validated physical models and parameters of bulk 3C–SiC aiming for credible technology computer aided design (TCAD) simulation
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Arvanitopoulos, A, Lophitis, N, Gyftakis, K N, Perkins, S and Antoniou, M. (2017) Validated physical models and parameters of bulk 3C–SiC aiming for credible technology computer aided design (TCAD) simulation. Semiconductor Science and Technology, 32 (10). 104009. doi:10.1088/1361-6641/aa856b ISSN 0268-1242.
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Official URL: http://dx.doi.org/10.1088/1361-6641/aa856b
Abstract
The cubic form of SiC (β- or 3C-) compared to the hexagonal α-SiC polytypes, primarily 4H- and 6H–SiC, has lower growth cost and can be grown heteroepitaxially in large area silicon (Si) wafers which makes it of special interest. This in conjunction with the recently reported growth of improved quality 3C–SiC, make the development of devices an imminent objective. However, the readiness of models that accurately predict the material characteristics, properties and performance is an imperative requirement for attaining the design and optimization of functional devices. The purpose of this study is to provide and validate a comprehensive set of models alongside with their parameters for bulk 3C–SiC. The validation process revealed that the proposed models are in a very good agreement to experimental data and confidence ranges were identified. This is the first piece of work achieving that for 3C–SiC. Considerably, it constitutes the necessary step for finite element method simulations and technology computer aided design.
Item Type: | Journal Article | ||||||
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Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||||
Journal or Publication Title: | Semiconductor Science and Technology | ||||||
Publisher: | Institute of Physics Publishing Ltd. | ||||||
ISSN: | 0268-1242 | ||||||
Official Date: | 19 September 2017 | ||||||
Dates: |
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Volume: | 32 | ||||||
Number: | 10 | ||||||
Article Number: | 104009 | ||||||
DOI: | 10.1088/1361-6641/aa856b | ||||||
Status: | Peer Reviewed | ||||||
Publication Status: | Published | ||||||
Access rights to Published version: | Restricted or Subscription Access | ||||||
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