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Quantifying the benefits of image restoration

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UNSPECIFIED (2000) Quantifying the benefits of image restoration. In: Conference on Passive Millimeter-Wave Imaging Technology IV, ORLANDO, FL, APR 26, 2000. Published in: PASSIVE MILLIMETER-WAVE IMAGING TECHNOLOGY IV, 4032 pp. 140-146. ISBN 0-8194-3658-5. ISSN 0277-786X.

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Abstract

To quantify the benefits of applying image restoration algorithms to passive millimetre imagery a synthetic scene was generated and restored and the image quality assessed. The synthetic scene consisted of a three bar fan pattern and a large rectangular black area. This pattern was blurred with a Gaussian point spread function, and two- percent noise added to the simulated imagery. The blurred noisy image was then passed through a series of image restoration algorithms.

A comparison was made between the MAP and the Wiener image restoration algorithms in terms of three quantities calculated before and after restoration, the rms noise, the point spread function and Gibbs ringing. The images were then compared to images taken using the DERA MITRE imager of an actual three bar fan pattern constructed from Stirling board. It was found that the performance of the algorithms on real imagery was limited by fixed pattern noise generated by the imaging process. The real data was improved further by applying a two-point correction based on features in the image and although an improvement was visible, the restoration was not as good as that observed for the synthetic data.

Item Type: Conference Item (UNSPECIFIED)
Subjects: Q Science > QC Physics
Series Name: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
Journal or Publication Title: PASSIVE MILLIMETER-WAVE IMAGING TECHNOLOGY IV
Publisher: SPIE-INT SOC OPTICAL ENGINEERING
ISBN: 0-8194-3658-5
ISSN: 0277-786X
Editor: Smith, RM and Appleby, R
Official Date: 2000
Dates:
DateEvent
2000UNSPECIFIED
Volume: 4032
Number of Pages: 7
Page Range: pp. 140-146
Publication Status: Published
Title of Event: Conference on Passive Millimeter-Wave Imaging Technology IV
Location of Event: ORLANDO, FL
Date(s) of Event: APR 26, 2000

Data sourced from Thomson Reuters' Web of Knowledge

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