Skip to content Skip to navigation
University of Warwick
  • Study
  • |
  • Research
  • |
  • Business
  • |
  • Alumni
  • |
  • News
  • |
  • About

University of Warwick
Publications service & WRAP

Highlight your research

  • WRAP
    • Home
    • Search WRAP
    • Browse by Warwick Author
    • Browse WRAP by Year
    • Browse WRAP by Subject
    • Browse WRAP by Department
    • Browse WRAP by Funder
    • Browse Theses by Department
  • Publications Service
    • Home
    • Search Publications Service
    • Browse by Warwick Author
    • Browse Publications service by Year
    • Browse Publications service by Subject
    • Browse Publications service by Department
    • Browse Publications service by Funder
  • Help & Advice
University of Warwick

The Library

  • Login
  • Admin

Long term reliability of power modules with low amplitude thermomechanical stresses and initial defects

Tools
- Tools
+ Tools

Hu, Borong, Konaklieva, Sylvia, Ran, Li, Kourra, Nadia, Williams, Mark A., Lai, Wei and Mawby, Philip. A. (2018) Long term reliability of power modules with low amplitude thermomechanical stresses and initial defects. In: 2018 IEEE Energy Conversion Congress and Exposition (ECCE), Portland, OR, USA, 23 - 27 Sep 2018. Published in: 2018 IEEE Energy Conversion Congress and Exposition (ECCE) ISBN 9781479973125. doi:10.1109/ECCE.2018.8558137

Research output not available from this repository.

Request-a-Copy directly from author or use local Library Get it For Me service.

Official URL: http://dx.doi.org/10.1109/ECCE.2018.8558137

Request Changes to record.

Abstract

Solder-attached IGBT power modules are widely use in renewable energy and smart grid applications where the thermomechanical stress cycles are relatively low in amplitude but the service duties of the devices are expected to last for decades. Although the initial defect voids and cracks in the solder layer are widely recognized as the triggers of initial aging, it is still necessary to describe and simulate the physical fatigue behavior in their local regions accurately under low amplitude stress cycling. In order to investigate the growth of the damage, in this paper a 2D symmetrical finite element analysis (FEA) model is developed to evaluate the thermo mechanical behavior of the solder layer with initial defects, and this is verified by a combination of power cycling test and micro-resolution computed tomography (CT) scanning. The modeling and its experimental validation provides an understanding that the voids distributed in the solder layer may transfer into initial cracks which then grow progressively rapidly; the voids adjacent to the chip-solder interface will particularly reduce the lifetime. This establishes the basis of a modeling theory for further investigation of the damage progress on solder interface.

Item Type: Conference Item (Paper)
Divisions: Faculty of Science, Engineering and Medicine > Engineering > Engineering
Faculty of Science, Engineering and Medicine > Engineering > WMG (Formerly the Warwick Manufacturing Group)
Journal or Publication Title: 2018 IEEE Energy Conversion Congress and Exposition (ECCE)
Publisher: IEEE
ISBN: 9781479973125
Official Date: 6 December 2018
Dates:
DateEvent
6 December 2018Published
27 September 2018Accepted
DOI: 10.1109/ECCE.2018.8558137
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
Date of first compliant deposit: 24 October 2019
Conference Paper Type: Paper
Title of Event: 2018 IEEE Energy Conversion Congress and Exposition (ECCE)
Type of Event: Conference
Location of Event: Portland, OR, USA
Date(s) of Event: 23 - 27 Sep 2018

Request changes or add full text files to a record

Repository staff actions (login required)

View Item View Item
twitter

Email us: wrap@warwick.ac.uk
Contact Details
About Us