Structure and optical properties of nanocrystalline erbia doped zirconia thin films
UNSPECIFIED. (2000) Structure and optical properties of nanocrystalline erbia doped zirconia thin films. INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 14 (11). pp. 1239-1248. ISSN 0217-9792Full text not available from this repository.
Thin films of zirconia doped with erbia in the concentration range of 5 to 15% have been prepared on quartz substrates by an inorganic and aqueous sol-gel method. The films were crystalline, continuous and single phase as deposited, with a cubic fluorite structure and crystallite sizes of 8-10 nm as shown by X-ray diffraction. The films were annealed to 600 and 1050 degrees C after deposition and found to be transparent in the region between 400 to 1100 nm, the crystalline structure becoming tetragonal at 1050 degrees C with crystallite sizes of around 30-40 nm. The refractive index increased with increase in annealing temperature. There is a peak in the refractive index at a dopant concentration of 10% where it achieves a value of 1.88 at 700 nm. The optical absorption edge shows a similar peak at the same dopant concentration with a value of 5.65 eV.
|Item Type:||Journal Article|
|Subjects:||Q Science > QC Physics|
|Journal or Publication Title:||INTERNATIONAL JOURNAL OF MODERN PHYSICS B|
|Publisher:||WORLD SCIENTIFIC PUBL CO PTE LTD|
|Date:||10 May 2000|
|Number of Pages:||10|
|Page Range:||pp. 1239-1248|
Actions (login required)