In situ diffraction measurement of the polymerization of C-60 at high temperatures and pressures
UNSPECIFIED (2000) In situ diffraction measurement of the polymerization of C-60 at high temperatures and pressures. [Journal Item]Full text not available from this repository.
In situ energy dispersive x-ray measurements were performed on C-60 fullerene at pressures of 2.6, 5.7 and 12 GPa and temperatures between 300 and 1100 K. The polymerization process was followed in detail and the dynamics of the phase changes measured This has enabled us to map the P-T phase diagram and look at the dynamics of the phase transformations.
|Item Type:||Journal Item|
|Subjects:||Q Science > QC Physics|
|Journal or Publication Title:||JOURNAL OF PHYSICS-CONDENSED MATTER|
|Publisher:||IOP PUBLISHING LTD|
|Date:||17 July 2000|
|Number of Pages:||6|
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