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Structure of (Ta2O5)(x)(SiO2)(1-x) xerogels (x=0.05, 0.11, 0.18, 0.25 and 1.0) from FTIR, Si-29 and O-17 MAS NMR and EXAFS

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UNSPECIFIED (2000) Structure of (Ta2O5)(x)(SiO2)(1-x) xerogels (x=0.05, 0.11, 0.18, 0.25 and 1.0) from FTIR, Si-29 and O-17 MAS NMR and EXAFS. JOURNAL OF MATERIALS CHEMISTRY, 10 (8). pp. 1887-1894. ISSN 0959-9428

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Abstract

A combination of Si-29 and O-17 MAS NMR, EXAFS and FT-IR spectroscopy has been used to study the atomic structure of (Ta2O5)(x)(SiO2)(1 - x) (x = 0.05, 0.11, 0.18 and 0.25) xerogels prepared by reacting partially-hydrolysed tetraethyl orthosilicate with tantalum(V) ethoxide. Amorphous tantala, a-Ta2O5, xerogels have also been prepared and their structures studied in detail for the first time. Results have shown that in all these materials, Ta adopts predominantly 5-fold coordination with respect to oxygen. For the mixed oxide xerogels, partial phase separation of the two component oxides occurs for x > 0.11.

Item Type: Journal Article
Subjects: Q Science > QD Chemistry
T Technology > TA Engineering (General). Civil engineering (General)
Journal or Publication Title: JOURNAL OF MATERIALS CHEMISTRY
Publisher: ROYAL SOC CHEMISTRY
ISSN: 0959-9428
Date: 2000
Volume: 10
Number: 8
Number of Pages: 8
Page Range: pp. 1887-1894
Publication Status: Published
URI: http://wrap.warwick.ac.uk/id/eprint/13154

Data sourced from Thomson Reuters' Web of Knowledge

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