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In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate
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UNSPECIFIED (2000) In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate. JOURNAL OF PHYSICS-CONDENSED MATTER, 12 (15). pp. 3521-3529. ISSN 0953-8984
Full text not available from this repository.Abstract
In situ high temperature x-ray diffraction measurements have been performed on a (TiO2)(0.18) (SiO2)(0.82) xerogel using a 185 mm radius curved image-plate. The results clearly show that the coordination of Ti in this material changes from predominantly sixfold to predominantly fourfold as the temperature is increased from 25 degrees C to 310 degrees C An increase in the average O-O distance associated with this change is also identified. The use of the curved image-plate is shown to be a valuable technique for in situ studies of structural changes associated with thermal treatment of materials.
| Item Type: | Journal Article |
|---|---|
| Subjects: | Q Science > QC Physics |
| Journal or Publication Title: | JOURNAL OF PHYSICS-CONDENSED MATTER |
| Publisher: | IOP PUBLISHING LTD |
| ISSN: | 0953-8984 |
| Date: | 17 April 2000 |
| Volume: | 12 |
| Number: | 15 |
| Number of Pages: | 9 |
| Page Range: | pp. 3521-3529 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/13417 |
Data sourced from Thomson Reuters' Web of Knowledge
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