In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate
UNSPECIFIED (2000) In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate. JOURNAL OF PHYSICS-CONDENSED MATTER, 12 (15). pp. 3521-3529. ISSN 0953-8984Full text not available from this repository.
In situ high temperature x-ray diffraction measurements have been performed on a (TiO2)(0.18) (SiO2)(0.82) xerogel using a 185 mm radius curved image-plate. The results clearly show that the coordination of Ti in this material changes from predominantly sixfold to predominantly fourfold as the temperature is increased from 25 degrees C to 310 degrees C An increase in the average O-O distance associated with this change is also identified. The use of the curved image-plate is shown to be a valuable technique for in situ studies of structural changes associated with thermal treatment of materials.
|Item Type:||Journal Article|
|Subjects:||Q Science > QC Physics|
|Journal or Publication Title:||JOURNAL OF PHYSICS-CONDENSED MATTER|
|Publisher:||IOP PUBLISHING LTD|
|Date:||17 April 2000|
|Number of Pages:||9|
|Page Range:||pp. 3521-3529|
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