Surface characterization and roughness measurement in engineering
UNSPECIFIED (2000) Surface characterization and roughness measurement in engineering. [Journal Item]Full text not available from this repository.
Surfaces are becoming more important especially as miniaturization progresses and with the advent of micro mechanics. The role of the surface is explored with respect to control of manufacture and prediction of performances at interfaces and rubbing bodies. This is developed to include some aspects of designer surfaces. Instruments for measuring surfaces are critically examined. These include the well-known stylus method, optical methods and the new generation of scanning probe methods: Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM). Finally, the ways in which surfaces are characterized from profile traces and over an area are described.
|Item Type:||Journal Item|
|Subjects:||Q Science > QC Physics|
|Series Name:||TOPICS IN APPLIED PHYSICS|
|Journal or Publication Title:||PHOTO-MECHANICS|
|Number of Pages:||49|
|Page Range:||pp. 413-461|
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