UNSPECIFIED (2000) Surface characterization and roughness measurement in engineering. [Journal Item]

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Abstract

Surfaces are becoming more important especially as miniaturization progresses and with the advent of micro mechanics. The role of the surface is explored with respect to control of manufacture and prediction of performances at interfaces and rubbing bodies. This is developed to include some aspects of designer surfaces. Instruments for measuring surfaces are critically examined. These include the well-known stylus method, optical methods and the new generation of scanning probe methods: Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM). Finally, the ways in which surfaces are characterized from profile traces and over an area are described.

Item Type:	Journal Item
Subjects:	Q Science > QC Physics
Series Name:	TOPICS IN APPLIED PHYSICS
Journal or Publication Title:	PHOTO-MECHANICS
Publisher:	SPRINGER-VERLAG BERLIN
ISSN:	0303-4216
Date:	2000
Volume:	77
Number of Pages:	49
Page Range:	pp. 413-461
Publication Status:	Published
URI:	http://wrap.warwick.ac.uk/id/eprint/13452

Data sourced from Thomson Reuters' Web of Knowledge

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