Combined scanning electrochemical-atomic force microscopy
UNSPECIFIED (2000) Combined scanning electrochemical-atomic force microscopy. ANALYTICAL CHEMISTRY, 72 (2). pp. 276-285. ISSN 0003-2700Full text not available from this repository.
A combined scanning electrochemical microscope (SECM)atomic force microscope (AFM) is described. The instrument permits the first simultaneous topographical and electrochemical measurements at surfaces, under fluid, with high spatial resolution. Simple probe tips suitable for SECM-AFM, have been fabricated by coating flattened and etched Pt microwires with insulating, electrophoretically deposited paint. The flattened portion of the probe provides a flexible cantilever (force sensor), while the coating insulates the probe such that only the tip end (electrode) is exposed to the solution. The SECM-AFM technique is illustrated with simultaneous electrochemical-probe deflection approach curves, simultaneous topographical and electrochemical imaging studies of tracketched polycarbonate ultrafiltration membranes, and etching studies of crystal surfaces.
|Item Type:||Journal Article|
|Subjects:||Q Science > QD Chemistry|
|Journal or Publication Title:||ANALYTICAL CHEMISTRY|
|Publisher:||AMER CHEMICAL SOC|
|Date:||15 January 2000|
|Number of Pages:||10|
|Page Range:||pp. 276-285|
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