Skip to content Skip to navigation
University of Warwick
  • Study
  • |
  • Research
  • |
  • Business
  • |
  • Alumni
  • |
  • News
  • |
  • About

University of Warwick
Publications service & WRAP

Highlight your research

  • WRAP
    • Home
    • Search WRAP
    • Browse by Warwick Author
    • Browse WRAP by Year
    • Browse WRAP by Subject
    • Browse WRAP by Department
    • Browse WRAP by Funder
    • Browse Theses by Department
  • Publications Service
    • Home
    • Search Publications Service
    • Browse by Warwick Author
    • Browse Publications service by Year
    • Browse Publications service by Subject
    • Browse Publications service by Department
    • Browse Publications service by Funder
  • Statistics
  • Help & Advice
University of Warwick

The Library

  • Login

Reaction of Si (100) with silane-methane low-power plasma: SiC buffer-layer formation

Tools
- Tools
+ Tools

UNSPECIFIED (1999) Reaction of Si (100) with silane-methane low-power plasma: SiC buffer-layer formation. JOURNAL OF APPLIED PHYSICS, 86 (8). pp. 4643-4648. ISSN 0021-8979

Full text not available from this repository.

Abstract

The formation of a SiC buffer layer on Si (100) at substrate temperature as low as 950 degrees C using radicals of methane molecules obtained in a low-power-density glow-discharge plasma, is presented. The x-ray photoemission spectroscopy and low-energy-yield spectroscopy performed in the constant final-state mode suggest that the layers obtained were stoichiometric. To understand the mechanism of heteroepitaxial silicon carbide growth, the early stage of SiC nucleation was observed by atomic force microscopy and reflection high-energy electron diffraction. The results reveal that three-dimensional epitaxial crystallites nucleate at the earliest growth stage followed by a further Volmer-Weber growth. (C) 1999 American Institute of Physics. [S0021-8979(99)04620-4].

Item Type: Journal Article
Subjects: Q Science > QC Physics
Journal or Publication Title: JOURNAL OF APPLIED PHYSICS
Publisher: AMER INST PHYSICS
ISSN: 0021-8979
Date: 15 October 1999
Volume: 86
Number: 8
Number of Pages: 6
Page Range: pp. 4643-4648
Publication Status: Published
URI: http://wrap.warwick.ac.uk/id/eprint/14157

Data sourced from Thomson Reuters' Web of Knowledge

Request changes to a record

Actions (login required)

View Item View Item
twitter

Email us: publications@warwick.ac.uk
Contact Details
About Us