The physics of ionization chambers - or how to improve your signal-to-noise ratio for transmission EXAFS measurements
UNSPECIFIED (1999) The physics of ionization chambers - or how to improve your signal-to-noise ratio for transmission EXAFS measurements. In: 10th International Conference on XAFS (XAFS X), ILLINOIS INST TECHNOL, CHICAGO, ILLINOIS, AUG 10-14, 1998. Published in: JOURNAL OF SYNCHROTRON RADIATION, 6 (Part 3). pp. 217-219.Full text not available from this repository.
We review the physical processes which may limit the performance of the ion chamber in making transmission EXAFS measurements. It is found that the recombination current loss is approximately proportional to the square of the saturation current and inversely proportional to the square of the applied voltage. We demonstrate the quality of data which can be achieved by measuring the rhodium K adsorption edge (T=30K and 290K) recorded at ESRF BM29, with noise levels approaching the photon counting limit. The EXAFS from this data has an error in the fine-structure function Delta chi approximate to 5 x 10(-5).
|Item Type:||Conference Item (UNSPECIFIED)|
|Subjects:||Q Science > QC Physics|
|Journal or Publication Title:||JOURNAL OF SYNCHROTRON RADIATION|
|Publisher:||MUNKSGAARD INT PUBL LTD|
|Official Date:||1 May 1999|
|Number of Pages:||3|
|Page Range:||pp. 217-219|
|Title of Event:||10th International Conference on XAFS (XAFS X)|
|Location of Event:||ILLINOIS INST TECHNOL, CHICAGO, ILLINOIS|
|Date(s) of Event:||AUG 10-14, 1998|
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