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The physics of ionization chambers - or how to improve your signal-to-noise ratio for transmission EXAFS measurements

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UNSPECIFIED (1999) The physics of ionization chambers - or how to improve your signal-to-noise ratio for transmission EXAFS measurements. In: 10th International Conference on XAFS (XAFS X), AUG 10-14, 1998, ILLINOIS INST TECHNOL, CHICAGO, ILLINOIS.

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Abstract

We review the physical processes which may limit the performance of the ion chamber in making transmission EXAFS measurements. It is found that the recombination current loss is approximately proportional to the square of the saturation current and inversely proportional to the square of the applied voltage. We demonstrate the quality of data which can be achieved by measuring the rhodium K adsorption edge (T=30K and 290K) recorded at ESRF BM29, with noise levels approaching the photon counting limit. The EXAFS from this data has an error in the fine-structure function Delta chi approximate to 5 x 10(-5).

Item Type: Conference Item (UNSPECIFIED)
Subjects: Q Science > QC Physics
Journal or Publication Title: JOURNAL OF SYNCHROTRON RADIATION
Publisher: MUNKSGAARD INT PUBL LTD
ISSN: 0909-0495
Date: 1 May 1999
Volume: 6
Number: Part 3
Number of Pages: 3
Page Range: pp. 217-219
Publication Status: Published
Title of Event: 10th International Conference on XAFS (XAFS X)
Location of Event: ILLINOIS INST TECHNOL, CHICAGO, ILLINOIS
Date(s) of Event: AUG 10-14, 1998
URI: http://wrap.warwick.ac.uk/id/eprint/14389

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