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UIS performance and ruggedness of stand-alone and cascode SiC JFETs
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Agbo, S. N., Ortiz Gonzalez, Jose Angel, Wu, R., Jahdi, S. and Alatise, Olayiwola M. (2020) UIS performance and ruggedness of stand-alone and cascode SiC JFETs. Microelectronics Reliability . 113803. doi:10.1016/j.microrel.2020.113803 (In Press)
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WRAP-UIS-performance-ruggedness-stand-alone-cascode-SiC-JFETs-Alatise-2020.pdf - Accepted Version Embargoed item. Restricted access to Repository staff only until 1 November 2021. Contact author directly, specifying your specific needs. - Requires a PDF viewer. Available under License Creative Commons Attribution Non-commercial No Derivatives 4.0. Download (1775Kb) |
Official URL: http://dx.doi.org/10.1016/j.microrel.2020.113803
Abstract
In this paper the ruggedness of stand-alone and cascode SiC JFETs is evaluated under single and repetitive unclamped inductive switching (UIS). The impact of the JFET gate resistance, avalanche current and temperature are evaluated. The results show that the avalanche characteristics are strongly affected by the peak avalanche current and the JFET gate resistance. Due to the absence of an insulating gate, there is significant JFET gate current during avalanche. This gate leakage current plays a fundamental role on the reduced performance under repetitive UIS of SiC cascode JFETs compared with stand-alone SiC JFETs.
| Item Type: | Journal Article | ||||||
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| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering T Technology > TP Chemical technology |
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| Divisions: | Faculty of Science > Engineering | ||||||
| Library of Congress Subject Headings (LCSH): | Silicon carbide , Field-effect transistors, Microelectronics , Industrial electronics | ||||||
| Journal or Publication Title: | Microelectronics Reliability | ||||||
| Publisher: | Pergamon-Elsevier Science Ltd. | ||||||
| ISSN: | 0026-2714 | ||||||
| Official Date: | 1 November 2020 | ||||||
| Dates: |
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| Date of first compliant deposit: | 5 November 2020 | ||||||
| Article Number: | 113803 | ||||||
| DOI: | 10.1016/j.microrel.2020.113803 | ||||||
| Status: | Peer Reviewed | ||||||
| Publication Status: | In Press | ||||||
| Access rights to Published version: | Restricted or Subscription Access | ||||||
| RIOXX Funder/Project Grant: |
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