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Parameters influencing the maximum controllable current in gate commutated thyristors

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Lophitis, Neophytos, Antoniou, Marina, Udrea, Florin, Nistor, Iulian, Arnold, Martin, Wikström, Tobias and Vobecky, Jan (2014) Parameters influencing the maximum controllable current in gate commutated thyristors. IET Circuits, Devices & Systems, 8 (3). pp. 221-226. doi:10.1049/iet-cds.2013.0217

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Official URL: http://dx.doi.org/10.1049/iet-cds.2013.0217

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Abstract

The model of interconnected numerical device segments can give a prediction on the dynamic performance of large area full wafer devices such as the Gate Commutated Thyristors (GCTs) and can be used as an optimisation tool for designing GCTs. In this study the authors evaluate the relative importance of the shallow p‐base thickness, its peak concentration, the depth of the p‐base and the buffer peak concentration.

Item Type: Journal Article
Divisions: Faculty of Science > Engineering
Journal or Publication Title: IET Circuits, Devices & Systems
ISSN: 1751-858X
Official Date: 2014
Dates:
DateEvent
2014Published
Volume: 8
Number: 3
Page Range: pp. 221-226
DOI: 10.1049/iet-cds.2013.0217
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access

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