The Library
Optimal edge termination for high oxide reliability aiming 10kV SiC n-IGBTs
Tools
Tools
Tools
Perkins, S., Antoniou, M., Tiwari, Amit K., Arvanitopoulos, A., Gyftakis, K. N., Trajkovic, T., Udrea, F. and Lophitis, N. (2019) Optimal edge termination for high oxide reliability aiming 10kV SiC n-IGBTs. In: IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED), Toulouse, France, 27-30 Aug 2019 pp. 358-363. ISBN 9781728118338. doi:10.1109/DEMPED.2019.8864919
Research output not available from this repository, contact author.
Official URL: http://dx.doi.org/10.1109/DEMPED.2019.8864919
Abstract
The edge termination design strongly affects the ability of a power device to support the desired voltage and its reliable operation. In this paper we present three appropriate termination designs for 10kV n-IGBTs which achieve the desired blocking requirement without the need for deep and expensive implantations. Thus, they improve the ability to fabricate, minimise the cost and reduce the lattice damage due to the high implantation energy. The edge terminations presented are optimised both for achieving the widest immunity to dopant activation and to minimise the electric field at the oxide. Thus, they ensure the long-term reliability of the device. This work has shown that the optimum design for blocking voltage and widest dose window does not necessarily give the best design for reliability. Further, it has been shown that Hybrid Junction Termination Extension structure with Space Modulated Floating Field Rings can give the best result of very high termination efficiency, as high as 99%, the widest doping variation immunity and the lowest electric field in the oxide.
| Item Type: | Conference Item (Paper) | ||||||
|---|---|---|---|---|---|---|---|
| Divisions: | Faculty of Science > Engineering | ||||||
| Publisher: | IEEE | ||||||
| ISBN: | 9781728118338 | ||||||
| Book Title: | 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) | ||||||
| Official Date: | 2019 | ||||||
| Dates: |
|
||||||
| Page Range: | pp. 358-363 | ||||||
| DOI: | 10.1109/DEMPED.2019.8864919 | ||||||
| Status: | Peer Reviewed | ||||||
| Publication Status: | Published | ||||||
| Access rights to Published version: | Restricted or Subscription Access | ||||||
| Conference Paper Type: | Paper | ||||||
| Title of Event: | IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) | ||||||
| Type of Event: | Conference | ||||||
| Location of Event: | Toulouse, France | ||||||
| Date(s) of Event: | 27-30 Aug 2019 |
Request changes or add full text files to a record
Repository staff actions (login required)
 |
View Item |
