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Photoelectron diffraction study of ultrathin Fe films on Cu{111}
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UNSPECIFIED (1999) Photoelectron diffraction study of ultrathin Fe films on Cu{111}. PHYSICAL REVIEW B, 59 (3). pp. 2313-2319. ISSN 0163-1829
Full text not available from this repository.Abstract
Using photoelectron diffraction in the scanned-energy mode we show that at 300 K iron grows pseudomorphically on Cu{111} up to a thickness of about two equivalent monolayers. The Fe-Cu layer separation is 1.99 Angstrom. Above this thickness the film becomes bcc with {110} orientation and is aligned such that the [111] rows are parallel to the [110] rows of the fcc{111} surface (Kurdjumov-Sachs orientation). The Fe-Fe first-layer separation is 1.95 Angstrom. [S0163-1829(99)01903-7].
| Item Type: | Journal Article |
|---|---|
| Subjects: | Q Science > QC Physics |
| Journal or Publication Title: | PHYSICAL REVIEW B |
| Publisher: | AMERICAN PHYSICAL SOC |
| ISSN: | 0163-1829 |
| Date: | 15 January 1999 |
| Volume: | 59 |
| Number: | 3 |
| Number of Pages: | 7 |
| Page Range: | pp. 2313-2319 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/14913 |
Data sourced from Thomson Reuters' Web of Knowledge
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