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Photoelectron diffraction study of ultrathin Fe films on Cu{111}

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UNSPECIFIED (1999) Photoelectron diffraction study of ultrathin Fe films on Cu{111}. PHYSICAL REVIEW B, 59 (3). pp. 2313-2319. ISSN 0163-1829.

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Abstract

Using photoelectron diffraction in the scanned-energy mode we show that at 300 K iron grows pseudomorphically on Cu{111} up to a thickness of about two equivalent monolayers. The Fe-Cu layer separation is 1.99 Angstrom. Above this thickness the film becomes bcc with {110} orientation and is aligned such that the [111] rows are parallel to the [110] rows of the fcc{111} surface (Kurdjumov-Sachs orientation). The Fe-Fe first-layer separation is 1.95 Angstrom. [S0163-1829(99)01903-7].

Item Type: Journal Article
Subjects: Q Science > QC Physics
Journal or Publication Title: PHYSICAL REVIEW B
Publisher: AMERICAN PHYSICAL SOC
ISSN: 0163-1829
Official Date: 15 January 1999
Dates:
DateEvent
15 January 1999UNSPECIFIED
Volume: 59
Number: 3
Number of Pages: 7
Page Range: pp. 2313-2319
Publication Status: Published

Data sourced from Thomson Reuters' Web of Knowledge

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