UNSPECIFIED. (1999) Photoelectron diffraction study of ultrathin Fe films on Cu{111}. PHYSICAL REVIEW B, 59 (3). pp. 2313-2319. ISSN 0163-1829

Abstract

Using photoelectron diffraction in the scanned-energy mode we show that at 300 K iron grows pseudomorphically on Cu{111} up to a thickness of about two equivalent monolayers. The Fe-Cu layer separation is 1.99 Angstrom. Above this thickness the film becomes bcc with {110} orientation and is aligned such that the [111] rows are parallel to the [110] rows of the fcc{111} surface (Kurdjumov-Sachs orientation). The Fe-Fe first-layer separation is 1.95 Angstrom. [S0163-1829(99)01903-7].

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