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A novel application of transmission line theory in EMC assessment

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UNSPECIFIED (1997) A novel application of transmission line theory in EMC assessment. In: 10th International Conference on Electromagnetic Compatibility, SEP 01-03, 1997, UNIV WARWICK, COVENTRY, ENGLAND.

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Abstract

Products containing electronics must generally be tested for electromagnetic susceptibility, as part of their EMC certification process, at the development cycle to ensure that representative of any future use of the product. However the earlier that the product as a whole, or the electronic systems that form part of the product, can be tested for susceptibility, the more benefit, in terms of cost savings, can be gained. In the automotive industry, system-level testing can be used successfully by using a statistical technique to correlate results with the mandatory vehicle-level sign-off test. To test a whole vehicle early in its development would require the use of numerical electromagnetic modelling techniques. Due to lack of success in this area to date, there has been very little usage for EMC evaluation purposes. Based on transmission line theory and a similar statistical technique to that used successfully in system-level testing, a method is presented which could use real vehicle design data to generate both guidelines for designers and data for use in system-level tests. Initial results from a project to develop the method are also presented.

Item Type: Conference Item (UNSPECIFIED)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Series Name: IEE CONFERENCE PUBLICATIONS
Journal or Publication Title: INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC COMPATIBILITY
Publisher: INST ELECTRICAL ENGINEERS INSPEC INC
ISBN: 0-85296-695-4
ISSN: 0537-9989
Date: 1997
Number: 445
Number of Pages: 6
Page Range: pp. 181-186
Publication Status: Published
Title of Event: 10th International Conference on Electromagnetic Compatibility
Location of Event: UNIV WARWICK, COVENTRY, ENGLAND
Date(s) of Event: SEP 01-03, 1997
URI: http://wrap.warwick.ac.uk/id/eprint/15069

Data sourced from Thomson Reuters' Web of Knowledge

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