Characterization of thiolate species formation on Cu(111) using soft x-ray photoelectron spectroscopy
UNSPECIFIED (1998) Characterization of thiolate species formation on Cu(111) using soft x-ray photoelectron spectroscopy. JOURNAL OF PHYSICS-CONDENSED MATTER, 10 (39). pp. 8661-8670. ISSN 0953-8984Full text not available from this repository.
Soft x-ray photoelectron spectroscopy of the S 2p levels at relatively high spectral resolution has been used to characterize the interaction of methanethiol, CH3SH, ethanethiol, C2H5SH and dimethyl disulphide, (CH3S)(2) with a Cu(111) surface at temperatures from approximately 130 K to 500 K. The results are consistent with previous reports of the formation of a surface thiolate species at intermediate temperatures, but also provide clear evidence for two distinct surface intermediates in addition to the intact molecules and chemisorbed atomic sulphur reported previously for this surface. These two intermediates appear to be similar to the two thiolate species reported in studies on Ni(lll). Prior structural studies of the Cu(111)/CH3S- surface at room temperature show the surface to be reconstructed, and the lower temperature species identified here is assigned to a thiolate species on an unreconstructed surface, reconstruction being hindered at low temperatures. Additional evidence is found for two different atomic sulphur states in a narrow temperature range.
|Item Type:||Journal Article|
|Subjects:||Q Science > QC Physics|
|Journal or Publication Title:||JOURNAL OF PHYSICS-CONDENSED MATTER|
|Publisher:||IOP PUBLISHING LTD|
|Date:||5 October 1998|
|Number of Pages:||10|
|Page Range:||pp. 8661-8670|
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