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UNSPECIFIED. (1998) Nanometrology by x-ray interferometry. MEASUREMENT & CONTROL, 31 (2). pp. 43-47. ISSN 0020-2940
Full text not available from this repository.| Item Type: | Journal Article |
|---|---|
| Subjects: | T Technology > TL Motor vehicles. Aeronautics. Astronautics |
| Journal or Publication Title: | MEASUREMENT & CONTROL |
| Publisher: | INST MEASUREMENT CONTROL |
| ISSN: | 0020-2940 |
| Date: | March 1998 |
| Volume: | 31 |
| Number: | 2 |
| Number of Pages: | 5 |
| Page Range: | pp. 43-47 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/15877 |
Data sourced from Thomson Reuters' Web of Knowledge
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