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Nanometrology by x-ray interferometry

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UNSPECIFIED (1998) Nanometrology by x-ray interferometry. MEASUREMENT & CONTROL, 31 (2). pp. 43-47.

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Item Type: Journal Article
Subjects: T Technology > TL Motor vehicles. Aeronautics. Astronautics
Journal or Publication Title: MEASUREMENT & CONTROL
Publisher: INST MEASUREMENT CONTROL
ISSN: 0020-2940
Official Date: March 1998
Dates:
DateEvent
March 1998UNSPECIFIED
Volume: 31
Number: 2
Number of Pages: 5
Page Range: pp. 43-47
Publication Status: Published

Data sourced from Thomson Reuters' Web of Knowledge

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