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Nanometrology by x-ray interferometry
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UNSPECIFIED (1998) Nanometrology by x-ray interferometry. MEASUREMENT & CONTROL, 31 (2). pp. 43-47.
Full text not available from this repository, contact author.| Item Type: | Journal Article | ||||
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| Subjects: | T Technology > TL Motor vehicles. Aeronautics. Astronautics | ||||
| Journal or Publication Title: | MEASUREMENT & CONTROL | ||||
| Publisher: | INST MEASUREMENT CONTROL | ||||
| ISSN: | 0020-2940 | ||||
| Official Date: | March 1998 | ||||
| Dates: |
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| Volume: | 31 | ||||
| Number: | 2 | ||||
| Number of Pages: | 5 | ||||
| Page Range: | pp. 43-47 | ||||
| Publication Status: | Published |
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