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Simulations and measurements of failure modes in SiC Cascode JFETs under short circuit conditions
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Agbo, Sunday Nereus, Bashar, Erfan, Wu, Ruizhu, Mendy, Simon, Gonzalez, Jose Ortiz and Alatise, Olayiwola M. (2021) Simulations and measurements of failure modes in SiC Cascode JFETs under short circuit conditions. In: 2021 IEEE 22nd Workshop on Control and Modelling of Power Electronics (COMPEL), Cartagena, Colombia, 2-5 Nov 2021. Published in: 2021 IEEE 22nd Workshop on Control and Modelling of Power Electronics (COMPEL) pp. 1-7. ISSN 1093-5142. doi:10.1109/COMPEL52922.2021.9646031
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WRAP-Simulations-measurements-failure-modes-SiC-cascodes-JFETs-conditions-2021.pdf - Accepted Version - Requires a PDF viewer. Download (3672Kb) | Preview |
Official URL: http://dx.doi.org/10.1109/COMPEL52922.2021.9646031
Abstract
Using experimental measurements and finite element simulations, this paper investigates the failure mode of SiC Cascode JFETs under short circuit (SC) conditions. Unlike SiC MOSFETs, where failure results in a shorted gate-source terminal (resulting from gate oxide failure), in SiC Cascode JFETs, failure usually occurs in drain-source short with the gate of the Low Voltage (LV) silicon MOSFET still operational. Measurements show that after the LV Si MOSFET gate is turned OFF, a high tail current results in the Cascode drain terminal with the drain-source voltage falling to approximately half of the blocking voltage, suggesting that the JFET is in linear mode. Finite element simulations show that thermally generated carriers in the JFET depletion region cause high leakage currents through the internal JFET gate terminal capable of turning-ON the JFET (after turn-OFF of the LV Si MOSFET) into linear mode. The measured short circuit withstand time (SCWT) is shown to be independent of temperature unlike silicon MOSFETs where the SC withstand time increases with the initial temperature.
| Item Type: | Conference Item (Paper) | ||||||
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| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering T Technology > TP Chemical technology |
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| Divisions: | Faculty of Science > Engineering | ||||||
| Library of Congress Subject Headings (LCSH): | Short circuits , Silicon carbide , Field-effect transistors , Industrial electronics , Metal oxide semiconductor field-effect transistors | ||||||
| Journal or Publication Title: | 2021 IEEE 22nd Workshop on Control and Modelling of Power Electronics (COMPEL) | ||||||
| Publisher: | IEEE | ||||||
| ISSN: | 1093-5142 | ||||||
| Book Title: | 2021 IEEE 22nd Workshop on Control and Modelling of Power Electronics (COMPEL) | ||||||
| Official Date: | 23 December 2021 | ||||||
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| Page Range: | pp. 1-7 | ||||||
| DOI: | 10.1109/COMPEL52922.2021.9646031 | ||||||
| Status: | Peer Reviewed | ||||||
| Publication Status: | Published | ||||||
| Publisher Statement: | © 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | ||||||
| Access rights to Published version: | Restricted or Subscription Access | ||||||
| RIOXX Funder/Project Grant: |
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| Conference Paper Type: | Paper | ||||||
| Title of Event: | 2021 IEEE 22nd Workshop on Control and Modelling of Power Electronics (COMPEL) | ||||||
| Type of Event: | Conference | ||||||
| Location of Event: | Cartagena, Colombia | ||||||
| Date(s) of Event: | 2-5 Nov 2021 |
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