High-resolution x-ray diffraction and topographic study of ferroelectric domains and absolute structural polarity of KTiOPO4 via anomalous scattering
UNSPECIFIED. (1997) High-resolution x-ray diffraction and topographic study of ferroelectric domains and absolute structural polarity of KTiOPO4 via anomalous scattering. PHYSICAL REVIEW B, 56 (14). pp. 8559-8565. ISSN 0163-1829Full text not available from this repository.
Naturally occurring ferroelectric inversion domains in flux-grown crystals of KTiOPO4 have been investigated using anomalous-scattering, multiple-crystal multiple-reflection x-ray diffraction and topography. The absolute structural polarity of KTiOPO4 with respect to etching of the (001) and (00(1) over bar) surfaces has been determined via the differences in the integrated intensities of Bijvoet pairs of asymmetric reflections with CuK-(alpha 1) radiation. Using the combination of anomalous-scattering topography and domain-selective etching, two kinds of inversion domains have been observed, one type having a curved domain wall in a random orientation and the other having a zig-zag domain wall across the surface of crystal, but both of them are of the head-to-head configuration. These domains have been imaged in x-ray topographs by anomalous scattering and the changes in diffraction contrast are consistent with those expected from diffraction theory present here. The origin of the formation of the head-to-head domain configuration is discussed in the context of the structural characteristics of KTiOPO4.
|Item Type:||Journal Article|
|Subjects:||Q Science > QC Physics|
|Journal or Publication Title:||PHYSICAL REVIEW B|
|Publisher:||AMERICAN PHYSICAL SOC|
|Official Date:||1 October 1997|
|Number of Pages:||7|
|Page Range:||pp. 8559-8565|
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