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Single-pulse avalanche failure characterization of single and paralleled SiC MOSFETs
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Mao, Hua, Jiang, Huaping, Qiu, Guanqun, Zhang, Yifu, Zhong, Xiaohan, Feng, Hao and Ran, Li (2021) Single-pulse avalanche failure characterization of single and paralleled SiC MOSFETs. In: 2021 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia), Wuhan, China, 25-27 Aug 2021. Published in: 2021 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) pp. 467-471. ISBN 9781665418515. doi:10.1109/WiPDAAsia51810.2021.9656070
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Official URL: http://dx.doi.org/10.1109/WiPDAAsia51810.2021.9656...
Abstract
The voltage spikes generated by the turn-off of the high-speed switches can easily drive the devices into an avalanche mode and even failure. In order to study the silicon carbide (SiC) MOSFET“s avalanche limit of a single device and the influence of electrical parameters of paralleled devices, an unclamped inductance switching (UIS) test platform for single and paralleled SiC MOSFETs is set up. This paper summarizes the single-pulse avalanche limit of single MOSFET under different inductances and different temperatures through experiments. In addition, the characteristics of parallel connected MOSFETs under different electrical parameters are also analyzed, and the main factors that affect the avalanche failure are shown.
Item Type: | Conference Item (Paper) | ||||
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Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||
Journal or Publication Title: | 2021 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) | ||||
Publisher: | IEEE | ||||
ISBN: | 9781665418515 | ||||
Book Title: | 2021 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) | ||||
Official Date: | 3 January 2021 | ||||
Dates: |
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Page Range: | pp. 467-471 | ||||
DOI: | 10.1109/WiPDAAsia51810.2021.9656070 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Conference Paper Type: | Paper | ||||
Title of Event: | 2021 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) | ||||
Type of Event: | Conference | ||||
Location of Event: | Wuhan, China | ||||
Date(s) of Event: | 25-27 Aug 2021 |
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