X-ray photoelectron spectroscopy study of copper sodium silicate glass surfaces
UNSPECIFIED (1997) X-ray photoelectron spectroscopy study of copper sodium silicate glass surfaces. JOURNAL OF NON-CRYSTALLINE SOLIDS, 215 (2-3). pp. 271-282. ISSN 0022-3093Full text not available from this repository.
Copper oxide-containing, sodium silicate glasses with composition (0.70-x)SiO2-0.30Na(2)O-xCuO (x in the range 0-0.2), were prepared by conventional melting and casting. The surface structure has been investigated by X-ray photoelectron spectroscopy. Evidence for the presence of copper in the Cu+ state for glasses with x less than or equal to 0.14, and for both oxidation states (Cu+ and Cu2+) in the glass where x = 0.18, has been obtained from the ''shake up'' satellite structure of the Cu 2p core level spectra. A deconvolution procedure has been undertaken to determine quantitatively the [Cu2+]/[Cu-total] ratio. The non-bridging oxygen content, obtained from the deconvolution of the O 1s core level spectra, increases with increasing copper oxide content indicating that copper acts as a network modifier. The O 1s spectra were modelled in such a way as to separate the contributions from SiOCu and SiONa to the non-bridging oxygen signal. (C) 1997 Elsevier Science B.V.
|Item Type:||Journal Article|
|Subjects:||T Technology > TP Chemical technology
T Technology > TA Engineering (General). Civil engineering (General)
|Journal or Publication Title:||JOURNAL OF NON-CRYSTALLINE SOLIDS|
|Publisher:||ELSEVIER SCIENCE BV|
|Number of Pages:||12|
|Page Range:||pp. 271-282|
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