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Wideband ultrasonic time of flight diffraction combining B-scans and cross-sectional imaging
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Petcher, P. A. and Dixon, S. (2009) Wideband ultrasonic time of flight diffraction combining B-scans and cross-sectional imaging. AIP Conference Proceedings (No.1096). pp. 650-657. doi:10.1063/1.3114317 ISSN 0094-243X.
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Official URL: http://dx.doi.org/10.1063/1.3114317
Abstract
Time of Flight Diffraction and Imaging (ToFDI) is a new technique utilizing a sparse array of transducers and signal processing to improve B-Scan output and create a cross-sectional image of a sample. This paper describes preliminary work demonstrating the concept, including; Finite Element Modelling (FEM), basic processing, likely applications. The eventual aim is for fast and automated detection, identification, positioning and sizing for all defects in a sample with known basic characteristics, such as bulk and shear elastic moduli.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QC Physics | ||||
Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering Faculty of Science, Engineering and Medicine > Science > Physics |
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Library of Congress Subject Headings (LCSH): | Diffraction, Time-of-flight mass spectrometry, Cross-sectional imaging | ||||
Journal or Publication Title: | AIP Conference Proceedings | ||||
Publisher: | American Institute of Physics | ||||
ISBN: | 978-0-7354-0629-2 | ||||
ISSN: | 0094-243X | ||||
Editor: | Thompson, D. O. and Chimenti, Dale E. | ||||
Official Date: | 2009 | ||||
Dates: |
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Number: | No.1096 | ||||
Number of Pages: | 8 | ||||
Page Range: | pp. 650-657 | ||||
DOI: | 10.1063/1.3114317 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Description: | Conference proceedings of 35th Annual Review of Progress in Quantitative Nondestructive Evaluation, University of Chicago, Chicago, IL, 20-25 Jul 2008 |
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Conference Paper Type: | Paper | ||||
Type of Event: | Conference |
Data sourced from Thomson Reuters' Web of Knowledge
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