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Wideband ultrasonic time of flight diffraction combining B-scans and cross-sectional imaging

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Petcher, P. A. and Dixon, S. (2009) Wideband ultrasonic time of flight diffraction combining B-scans and cross-sectional imaging. AIP Conference Proceedings (No.1096). pp. 650-657. doi:10.1063/1.3114317

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Official URL: http://dx.doi.org/10.1063/1.3114317

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Abstract

Time of Flight Diffraction and Imaging (ToFDI) is a new technique utilizing a sparse array of transducers and signal processing to improve B-Scan output and create a cross-sectional image of a sample. This paper describes preliminary work demonstrating the concept, including; Finite Element Modelling (FEM), basic processing, likely applications. The eventual aim is for fast and automated detection, identification, positioning and sizing for all defects in a sample with known basic characteristics, such as bulk and shear elastic moduli.

Item Type: Journal Article
Subjects: Q Science > QC Physics
Divisions: Faculty of Science > Engineering
Faculty of Science > Physics
Library of Congress Subject Headings (LCSH): Diffraction, Time-of-flight mass spectrometry, Cross-sectional imaging
Journal or Publication Title: AIP Conference Proceedings
Publisher: American Institute of Physics
ISBN: 978-0-7354-0629-2
ISSN: 0094-243X
Editor: Thompson, D. O. and Chimenti, Dale E.
Official Date: 2009
Dates:
DateEvent
2009Published
Number: No.1096
Number of Pages: 8
Page Range: pp. 650-657
DOI: 10.1063/1.3114317
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
Description:

Conference proceedings of 35th Annual Review of Progress in Quantitative Nondestructive Evaluation, University of Chicago, Chicago, IL, 20-25 Jul 2008

Conference Paper Type: Paper
Type of Event: Conference

Data sourced from Thomson Reuters' Web of Knowledge

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