UNSPECIFIED (1997) Two methods for achieving sub-pixel resolution in phase difference determination by fringe pattern matching. In: Conference on Optical Inspection and Micromeasurements II, JUN 16-19, 1997, MUNICH, GERMANY.

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Abstract

This paper presents the methods of linear interpolation and polynomial curve fitting for achieving subpixel resolution in phase difference determination by fringe pattern matching. These two methods were examined by computer simulation and experiment. In computer simulation, the effects of the resolutions of imaging system were also discussed. The computer simulation and experimental results have shown that the method of linear interpolation and that of polynomial curve fitting can both be used to achieve sub-pixel resolution in the measurement of phase difference by fringe pattern matching. The phase difference between fringe patterns is easy to achieve by linear interpolation compared with polynomial curve fitting.

Item Type:	Conference Item (UNSPECIFIED)
Subjects:	Q Science > QC Physics
Series Name:	PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
Journal or Publication Title:	OPTICAL INSPECTION AND MICROMEASUREMENTS II
Publisher:	SPIE - INT SOC OPTICAL ENGINEERING
ISBN:	0-8194-2518-4
Editor:	Gorecki, C
Date:	1997
Volume:	3098
Number of Pages:	9
Page Range:	pp. 252-260
Publication Status:	Published
Title of Event:	Conference on Optical Inspection and Micromeasurements II
Location of Event:	MUNICH, GERMANY
Date(s) of Event:	JUN 16-19, 1997
URI:	http://wrap.warwick.ac.uk/id/eprint/17654

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