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The use of O1s charge referencing for the X-ray photoelectron spectroscopy of Al/Si, Al/Ti and Al/Zr mixed oxides
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UNSPECIFIED (1997) The use of O1s charge referencing for the X-ray photoelectron spectroscopy of Al/Si, Al/Ti and Al/Zr mixed oxides. JOURNAL OF MATERIALS SCIENCE LETTERS, 16 (1). pp. 1-3. ISSN 0261-8028
Full text not available from this repository.| Item Type: | Journal Article |
|---|---|
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Journal or Publication Title: | JOURNAL OF MATERIALS SCIENCE LETTERS |
| Publisher: | CHAPMAN HALL LTD |
| ISSN: | 0261-8028 |
| Date: | 1 January 1997 |
| Volume: | 16 |
| Number: | 1 |
| Number of Pages: | 3 |
| Page Range: | pp. 1-3 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/18077 |
Data sourced from Thomson Reuters' Web of Knowledge
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