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The validity of C1s charge referencing in the XPS of oxidised Al-Si alloys
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UNSPECIFIED (1996) The validity of C1s charge referencing in the XPS of oxidised Al-Si alloys. Surface Science, 103 (4). pp. 403-407. ISSN 0169-4332
Full text not available from this repository.Abstract
During a XPS study of oxide growth and segregation on commercial aluminium-silicon alloys, problems were encountered in the application of C1s charge referencing. Using the C1s peak maximum as a reference, shifts were observed in the aluminium and magnesium peak positions, particularly after high temperature oxidation, which could not be accounted for. Referencing against the native oxide O1s peak corrected the shifts. A consequent analysis of the C1s spectra revealed that the hydrocarbon contamination was reacting under the conditions used to oxidise the alloys. From the XPS results it is deduced that active sites on the oxidised alloy surface are responsible for catalytic cracking and oxidation of the adventitious hydrocarbon. Parallel studies on other heat treated oxidic systems have produced similar results. It is recommended that an alternative to C1s charge referencing should be used when performing XPS studies on heat treated oxidic systems.
| Item Type: | Journal Article |
|---|---|
| Subjects: | Q Science > QD Chemistry T Technology > TA Engineering (General). Civil engineering (General) Q Science > QC Physics |
| Journal or Publication Title: | Surface Science |
| Publisher: | ELSEVIER SCIENCE BV |
| ISSN: | 0169-4332 |
| Date: | December 1996 |
| Volume: | 103 |
| Number: | 4 |
| Number of Pages: | 5 |
| Page Range: | pp. 403-407 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/18168 |
Data sourced from Thomson Reuters' Web of Knowledge
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