UNSPECIFIED (1996) Optical study of MBE grown undoped Si-Si1-xGex/Si superlattices. In: XXV International School on Physics of Semiconducting Compounds, MAY 27-31, 1996, JASZOWIEC, POLAND.

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Abstract

Raman spectroscopy and spectroscopic ellipsometry have been used to characterize Si/Si-0.78 Ge-0.22 superlattices grown by molecular beam epitaxy on (001)Si at different substrate temperatures. The results are interpreted to give information on material and interface quality, layer thicknesses, and state of strain. The observed frequencies of zone-folded longitudinal acoustic phonons in a high quality sample agree well with those calculated using Rytov's theory of acoustic vibrations in layered media.

Item Type:	Conference Item (UNSPECIFIED)
Subjects:	Q Science > QC Physics
Journal or Publication Title:	ACTA PHYSICA POLONICA A
Publisher:	POLISH ACAD SCIENCES INST PHYSICS
ISSN:	0587-4246
Date:	November 1996
Volume:	90
Number:	5
Number of Pages:	5
Page Range:	pp. 1045-1049
Publication Status:	Published
Title of Event:	XXV International School on Physics of Semiconducting Compounds
Location of Event:	JASZOWIEC, POLAND
Date(s) of Event:	MAY 27-31, 1996
URI:	http://wrap.warwick.ac.uk/id/eprint/18189

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