UNSPECIFIED (1996) Chemical nature of the luminescent centre in fresh and aged porous silicon layers. In: International Symposium on Si Heterostructures - From Physics to Devices, SEP 11-14, 1995, IRAKLION, GREECE.

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Abstract

In this study we have used high resolution parallel electron energy loss spectroscopy (PEELS) and X-ray excited optical luminescence (XEOL) to investigate the chemical nature of the luminescence centre in fresh and aged porous silicon. Wt find that regardless of the non-stoichiometric oxides which were observed by PEELS in our fresh porous silicon layers Si-Si bonded material is involved in the luminescence process. However, in the case of aged porous silicon both Si-Si and Si-O bonded material are involved.

Item Type:	Conference Item (UNSPECIFIED)
Subjects:	Q Science > QD Chemistry T Technology > TA Engineering (General). Civil engineering (General) Q Science > QC Physics
Journal or Publication Title:	Surface Science
Publisher:	ELSEVIER SCIENCE BV
ISSN:	0169-4332
Date:	August 1996
Volume:	102
Number of Pages:	5
Page Range:	pp. 408-412
Publication Status:	Published
Title of Event:	International Symposium on Si Heterostructures - From Physics to Devices
Location of Event:	IRAKLION, GREECE
Date(s) of Event:	SEP 11-14, 1995
URI:	http://wrap.warwick.ac.uk/id/eprint/18369

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