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An integrated approach to adsorbate structure determination using photoelectron diffraction: Direct ''imaging'' and quantitative simulation

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UNSPECIFIED (1996) An integrated approach to adsorbate structure determination using photoelectron diffraction: Direct ''imaging'' and quantitative simulation. In: 13th International Vacuum Congress/9th International Conference on Solid Surfaces (IVC-13/ICSS-9), SEP 25-29, 1995, YOKOHAMA, JAPAN.

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Abstract

Using scanned-energy mode photoelectron diffraction (PhD) we have developed a two-stage methodology for the quantitative determination of the local geometry of molecular adsorbates on surfaces. The first stage involves the inversion of the experimental adsorbate photoelectron diffraction spectra using a direct method to obtain an ''image'' of the nearest neighbour substrate atoms. The underlying physics is essentially the same as that of inversion in photoelectron holography, but our method has been shown to be effective for many cases and does not require the collection of additional data. The second stage is to optimise the detailed structure indicated by this ''image'' using an iterative trial-and-error comparison of the same experimental spectra with the results of simulations based on multiple scattering calculations. Specific examples of this approach which relate to ammonia, CO and hydrocarbon surface chemistry are outlined in this short review; NH3 and NHx (NH or NH2) adsorbed on Cu(110), CH3O- on Ni(111) and C2H2 on Ni(111).

Item Type: Conference Item (UNSPECIFIED)
Subjects: Q Science > QD Chemistry
Q Science > QC Physics
Journal or Publication Title: Surface Science
Publisher: ELSEVIER SCIENCE BV
ISSN: 0039-6028
Date: 20 June 1996
Volume: 357
Number: 1-3
Number of Pages: 9
Page Range: pp. 19-27
Publication Status: Published
Title of Event: 13th International Vacuum Congress/9th International Conference on Solid Surfaces (IVC-13/ICSS-9)
Location of Event: YOKOHAMA, JAPAN
Date(s) of Event: SEP 25-29, 1995
URI: http://wrap.warwick.ac.uk/id/eprint/18605

Data sourced from Thomson Reuters' Web of Knowledge

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