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Metrological x-ray interferometry in the micrometre region
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UNSPECIFIED. (1996) Metrological x-ray interferometry in the micrometre region. NANOTECHNOLOGY, 7 (1). pp. 1-12. ISSN 0957-4484
Full text not available from this repository.Abstract
A 'free-standing' microdisplacement calibrator is described which utilizes a previously proposed but untested design of monolithic x-ray interferometer. The monolith is driven by a twist-compensating electromagnetic actuator and a specially designed 1 ppm current source and is held, along with its x-ray source and detectors, within a desk-top-mounted radiation enclosure. It is confirmed that highly traceable displacements resolved to a small fraction of a nanometre can be obtained over a continuous range of at least 10 mu m under conditions typical of a routine metrology room. An overview of the system and its performance is given, but this paper concentrates particularly on the monolith design and on vibration suppression
| Item Type: | Journal Article |
|---|---|
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) T Technology Q Science > QC Physics |
| Journal or Publication Title: | NANOTECHNOLOGY |
| Publisher: | IOP PUBLISHING LTD |
| ISSN: | 0957-4484 |
| Date: | March 1996 |
| Volume: | 7 |
| Number: | 1 |
| Number of Pages: | 12 |
| Page Range: | pp. 1-12 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/18744 |
Data sourced from Thomson Reuters' Web of Knowledge
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