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Comment on the possibility of partial deconvolution of SIMS depth profiles in 'An analytic form for the SIMS response function measured from ultra-thin impurity layers' - Reply
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UNSPECIFIED (1995) Comment on the possibility of partial deconvolution of SIMS depth profiles in 'An analytic form for the SIMS response function measured from ultra-thin impurity layers' - Reply. SURFACE AND INTERFACE ANALYSIS, 23 (13). pp. 900-901.
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Item Type: | Journal Item | ||||
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Subjects: | Q Science > QD Chemistry | ||||
Journal or Publication Title: | SURFACE AND INTERFACE ANALYSIS | ||||
Publisher: | JOHN WILEY & SONS LTD | ||||
ISSN: | 0142-2421 | ||||
Official Date: | December 1995 | ||||
Dates: |
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Volume: | 23 | ||||
Number: | 13 | ||||
Number of Pages: | 2 | ||||
Page Range: | pp. 900-901 | ||||
Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
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