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CORE-SHELL SPECTROSCOPY OF RAPIDLY OXIDIZED POROUS SILICON - LINKING THE CHEMICAL AND ELECTRONIC-STRUCTURE
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UNSPECIFIED (1995) CORE-SHELL SPECTROSCOPY OF RAPIDLY OXIDIZED POROUS SILICON - LINKING THE CHEMICAL AND ELECTRONIC-STRUCTURE. In: International Workshop on Light Emitting Low Dimensional Silicon Structures, LAGONISSI, GREECE, OCT 10-12, 1994. Published in: PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 190 (1). pp. 69-76. ISSN 0370-1972.
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Abstract
High resolution scanning transmission electron microscopy (STEM) and synchrotron X-ray excitation of luminescence (XEOL) is used to probe the chemical nature of the luminescence mechanisms of porous and rapidly oxidised porous silicon. It is concluded that for fresh porous silicon, Si-Si bonded material is involved in the luminescence. For oxidised material this is probably not the case, the chemical environment being SiO2.
Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | Q Science > QC Physics | ||||
Journal or Publication Title: | PHYSICA STATUS SOLIDI B-BASIC RESEARCH | ||||
Publisher: | AKADEMIE VERLAG GMBH | ||||
ISSN: | 0370-1972 | ||||
Official Date: | July 1995 | ||||
Dates: |
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Volume: | 190 | ||||
Number: | 1 | ||||
Number of Pages: | 8 | ||||
Page Range: | pp. 69-76 | ||||
Publication Status: | Published | ||||
Title of Event: | International Workshop on Light Emitting Low Dimensional Silicon Structures | ||||
Location of Event: | LAGONISSI, GREECE | ||||
Date(s) of Event: | OCT 10-12, 1994 |
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