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GRAZING INCIDENCE X-RAY REFLECTANCE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS ON THE SUB-NANOMETRE SCALE

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UNSPECIFIED (1994) GRAZING INCIDENCE X-RAY REFLECTANCE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS ON THE SUB-NANOMETRE SCALE. In: Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy, BOSTON, MA, NOV 29-DEC 03, 1993. Published in: DETERMINING NANOSCALE PHYSICAL PROPERTIES OF MATERIALS BY MICROSCOPY AND SPECTROSCOPY, 332 pp. 525-530.

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Item Type: Conference Item (UNSPECIFIED)
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Series Name: MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS
Journal or Publication Title: DETERMINING NANOSCALE PHYSICAL PROPERTIES OF MATERIALS BY MICROSCOPY AND SPECTROSCOPY
Publisher: MATERIALS RESEARCH SOC
ISBN: 1-55899-231-6
ISSN: 0272-9172
Editor: Sarikaya, M and Wickramasinghe, HK and Isaacson, M
Date: 1994
Volume: 332
Number of Pages: 6
Page Range: pp. 525-530
Publication Status: Published
Title of Event: Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy
Location of Event: BOSTON, MA
Date(s) of Event: NOV 29-DEC 03, 1993
URI: http://wrap.warwick.ac.uk/id/eprint/19617

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