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GRAZING INCIDENCE X-RAY REFLECTANCE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS ON THE SUB-NANOMETRE SCALE
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UNSPECIFIED (1994) GRAZING INCIDENCE X-RAY REFLECTANCE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS ON THE SUB-NANOMETRE SCALE. In: Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy, BOSTON, MA, NOV 29-DEC 03, 1993. Published in: DETERMINING NANOSCALE PHYSICAL PROPERTIES OF MATERIALS BY MICROSCOPY AND SPECTROSCOPY, 332 pp. 525-530. ISBN 1-55899-231-6. ISSN 0272-9172.
Full text not available from this repository, contact author.| Item Type: | Conference Item (UNSPECIFIED) | ||||
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| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) | ||||
| Series Name: | MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS | ||||
| Journal or Publication Title: | DETERMINING NANOSCALE PHYSICAL PROPERTIES OF MATERIALS BY MICROSCOPY AND SPECTROSCOPY | ||||
| Publisher: | MATERIALS RESEARCH SOC | ||||
| ISBN: | 1-55899-231-6 | ||||
| ISSN: | 0272-9172 | ||||
| Editor: | Sarikaya, M and Wickramasinghe, HK and Isaacson, M | ||||
| Official Date: | 1994 | ||||
| Dates: |
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| Volume: | 332 | ||||
| Number of Pages: | 6 | ||||
| Page Range: | pp. 525-530 | ||||
| Publication Status: | Published | ||||
| Title of Event: | Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy | ||||
| Location of Event: | BOSTON, MA | ||||
| Date(s) of Event: | NOV 29-DEC 03, 1993 |
Data sourced from Thomson Reuters' Web of Knowledge
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