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GRAZING INCIDENCE X-RAY REFLECTANCE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS ON THE SUB-NANOMETRE SCALE
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UNSPECIFIED (1994) GRAZING INCIDENCE X-RAY REFLECTANCE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS ON THE SUB-NANOMETRE SCALE. In: Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy, NOV 29-DEC 03, 1993, BOSTON, MA.
Full text not available from this repository.| Item Type: | Conference Item (UNSPECIFIED) |
|---|---|
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Series Name: | MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS |
| Journal or Publication Title: | DETERMINING NANOSCALE PHYSICAL PROPERTIES OF MATERIALS BY MICROSCOPY AND SPECTROSCOPY |
| Publisher: | MATERIALS RESEARCH SOC |
| ISBN: | 1-55899-231-6 |
| ISSN: | 0272-9172 |
| Editor: | Sarikaya, M and Wickramasinghe, HK and Isaacson, M |
| Date: | 1994 |
| Volume: | 332 |
| Number of Pages: | 6 |
| Page Range: | pp. 525-530 |
| Publication Status: | Published |
| Title of Event: | Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy |
| Location of Event: | BOSTON, MA |
| Date(s) of Event: | NOV 29-DEC 03, 1993 |
| URI: | http://wrap.warwick.ac.uk/id/eprint/19617 |
Data sourced from Thomson Reuters' Web of Knowledge
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